Nearfield Instruments B.V., founded in 2016, is a specialist in atomic force microscopy (AFM) systems for semiconductor metrology. The company's core technology delivers atom-scale resolution 3D measurements at throughputs suitable for industrial manufacturing environments, addressing a critical need in chip fabrication processes.
The company's product portfolio includes the QUADRA and AUDIRA AFM systems, both designed to provide high-resolution 3D metrology for semiconductor manufacturing applications. These systems represent an integration of expertise across atomic force microscopy, scanning probe microscopy, and nano-optomechatronic instrumentation.
Nearfield Instruments operates globally, serving the semiconductor manufacturing industry. The firm's technical focus sits at the intersection of precision measurement science and high-volume manufacturing requirements, developing instrumentation capable of characterizing features at the nanometer scale.
